X-ray diffraction microstructure analysis of mullite, quartz and corundum in porcelain insulators

Journal of the European Ceramic Society

Volumn 25, Issue 9, 2005, Pages 1479-1486

  Amigó, José M ^a   Serrano, Francisco J ^a   Kojdecki, Marek A ^b   Bastida, Joaquín ^a   Esteve, Vicente ^c   Reventós, María Mercedes ^a   Martí, Francisco ^d  

^a UNIVERSITY OF VALENCIA   (Spain)

^b MILITARY UNIVERSITY OF TECHNOLOGY   (Poland)

^c UNIVERSITAT JAUME I   (Spain)

^d Nalda SA   (Spain)

Author keywords

Al2O3; Crystallite size; Insulators; Mullite; Porcelain; SiO2; X ray methods

Indexed keywords

ALUMINA; ANISOTROPY; CORUNDUM; CRYSTALLINE MATERIALS; ELECTRIC INSULATORS; FIRING (OF MATERIALS); MICROSTRUCTURE; MINERALOGY; QUARTZ; SILICA; STRENGTH OF MATERIALS; X RAY DIFFRACTION ANALYSIS;

INTEGRAL BREADTH METHODS; MICROSTRUCTURE ANALYSIS; MULLITE; PORCELAIN INSULATORS;

PORCELAIN;

CERAMICS;

EID: 17844364675     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2004.05.019     Document Type: Article

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