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Thin Solid Films

Volumn 403-404, Issue , 2002, Pages 530-534

Raman study of Zn1-xBexSe/GaAs systems with low Be-content (x≤0.31)

(8) Ajjoun, M a Pages O a Laurenti, J P a Bormann, D b Chauvet, C c Tournie E c Faurie, J P c Gorochov, O d

a UNIVERSITY OF LIÈGE (Belgium)

b UNIVERSITÉ D'ARTOIS (France)

c CRHEA CNRS (France)

d CNRS (France)

Author keywords

Raman spectroscopy; Spatial correlation model; ZnBeSe

Indexed keywords

BERYLLIUM; OPTICAL PROPERTIES; OPTOELECTRONIC DEVICES; PHONONS; RAMAN SPECTROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; TENSILE STRENGTH;

SPATIAL CORRELATION MODELS;

SEMICONDUCTING ZINC COMPOUNDS;

EID: 17744408260 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(01)01548-6 Document Type: Conference Paper

Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.