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Volumn 2, Issue , 2000, Pages 444-449

An investigation toward new technologies and issues in power quality

Author keywords

Energy storage; Insulated gate bipolar transistors; Power electronics; Power generation; Power industry; Power quality; Power semiconductor devices; Power supplies; Power system reliability; Superconducting magnetic energy storage

Indexed keywords

BENCHMARKING; BIPOLAR SEMICONDUCTOR DEVICES; DELAY CIRCUITS; ELECTRIC ENERGY STORAGE; ELECTRIC POWER DISTRIBUTION; ELECTRIC POWER SYSTEMS; ELECTRONICS INDUSTRY; ENERGY STORAGE; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); MAGNETIC STORAGE; POWER ELECTRONICS; POWER GENERATION; POWER QUALITY; QUALITY CONTROL; SUPERCONDUCTING DEVICES; SUPERCONDUCTING MAGNETS; TIME DELAY;

EID: 17744397280     PISSN: 15406008     EISSN: 21640610     Source Type: Conference Proceeding    
DOI: 10.1109/ICHQP.2000.897720     Document Type: Conference Paper
Times cited : (12)

References (7)
  • 2
    • 84950130290 scopus 로고    scopus 로고
    • DSTATCOM to Extend the Capability of Voltage-Limited Distribution Feeders
    • April
    • S. M. Ramsay, et al, "DSTATCOM to Extend the Capability of Voltage-Limited Distribution Feeders", IEEE Rural Electric Power Conference, April. 1996.
    • (1996) IEEE Rural Electric Power Conference
    • Ramsay, S.M.1
  • 3
    • 0242698564 scopus 로고    scopus 로고
    • Voltage Sag Relief: Guidelines to Estimate DVR Equipment Ratings
    • April
    • R.J. Nelson, et al, "Voltage Sag Relief: Guidelines to Estimate DVR Equipment Ratings", American Power Conference, April 1996.
    • (1996) American Power Conference
    • Nelson, R.J.1
  • 4
    • 84950147821 scopus 로고    scopus 로고
    • Experience with a Static Series Compensation Device (DVR) at a Semiconductor facility
    • New Orleans, Louisiana
    • Eric John, "Experience with a Static Series Compensation Device (DVR) at a Semiconductor facility" 1999 IEE/PES Transmission and Distribution Conference and Exposition, New Orleans, Louisiana.
    • 1999 IEE/PES Transmission and Distribution Conference and Exposition
    • John, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.