메뉴 건너뛰기




Volumn 20, Issue 2 II, 2005, Pages 1738-1747

System voltage sag performance estimation

Author keywords

Power quality; Power system faults; Protective relay; Voltage sag

Indexed keywords

ALGORITHMS; ELECTRIC FAULT CURRENTS; ELECTRIC LOADS; ELECTRIC POTENTIAL; ELECTRIC POWER DISTRIBUTION; RELAY PROTECTION;

EID: 17744396943     PISSN: 08858977     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPWRD.2004.834341     Document Type: Article
Times cited : (49)

References (10)
  • 2
    • 0029207475 scopus 로고
    • "A survey of distribution system power quality-preliminary results"
    • Jan
    • E. W. Gunther and H. Mehta, "A survey of distribution system power quality-preliminary results," IEEE Trans Power Del., vol. 10, no. 1, pp. 322-329, Jan. 1995.
    • (1995) IEEE Trans. Power Del. , vol.10 , Issue.1 , pp. 322-329
    • Gunther, E.W.1    Mehta, H.2
  • 3
    • 0141986755 scopus 로고    scopus 로고
    • "Site variation and prediction of power quality"
    • Oct
    • T. A. Short, A. Mansoor, W. Sunderman, and A. Sundaram, "Site variation and prediction of power quality," IEEE Trans. Power Del., vol. 18, no. 4, pp. 1369-1375, Oct. 2003.
    • (2003) IEEE Trans. Power Del. , vol.18 , Issue.4 , pp. 1369-1375
    • Short, T.A.1    Mansoor, A.2    Sunderman, W.3    Sundaram, A.4
  • 4
    • 0020766624 scopus 로고
    • "Composite generation and transmission system adequacy evaluation including protection system failure modes"
    • Jun
    • R. Billington and J. Tatla, "Composite generation and transmission system adequacy evaluation including protection system failure modes," IEEE Trans. Power App. Syst., vol. PAS-102, no. 6, pp. 1823-1830, Jun. 1983.
    • (1983) IEEE Trans. Power App. Syst. , vol.PAS-102 , Issue.6 , pp. 1823-1830
    • Billington, R.1    Tatla, J.2
  • 5
    • 17744365140 scopus 로고    scopus 로고
    • ITI (CBEMA) Curve Application Note. Information Technology Industry Council (ITI). [Online]. Available
    • ITI (CBEMA) Curve Application Note. Information Technology Industry Council (ITI). [Online]. Available: http://www.itic.org
  • 6
    • 17744383148 scopus 로고    scopus 로고
    • "SEMI F47-0200 Specification for Semiconductor Processing Equipment Voltage Sag Immunity"
    • "SEMI F47-0200 Specification for Semiconductor Processing Equipment Voltage Sag Immunity,".
  • 7
    • 0031649512 scopus 로고    scopus 로고
    • "Indices for assessing utility distribution system RMS variation performance"
    • Jan
    • D. L. Brooks, R. C. Dugan, M. Waclawiak, and A. Sundaram, "Indices for assessing utility distribution system RMS variation performance," IEEE Trans. Power Del., vol. 13, no. 1, pp. 254-259, Jan. 1998.
    • (1998) IEEE Trans. Power Del. , vol.13 , Issue.1 , pp. 254-259
    • Brooks, D.L.1    Dugan, R.C.2    Waclawiak, M.3    Sundaram, A.4
  • 9
    • 0030286602 scopus 로고    scopus 로고
    • "Fast assessment methods for voltage sags in distribution systems"
    • Nov./Dec
    • M. H. J. Bollen, "Fast assessment methods for voltage sags in distribution systems," IEEE Trans. Ind. Appl., vol. 32, no. 6, Nov./Dec. 1996.
    • (1996) IEEE Trans. Ind. Appl. , vol.32 , Issue.6
    • Bollen, M.H.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.