Radiation trapping of the 3P1-1S0 resonant transitions of xenon and krypton in Xe-Kr, Xe-Ar, and Kr-Ar mixtures: Kinetic analysis and determination of the van der Waals broadening coefficients

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 62, Issue 5, 2000, Pages 052721-052721

  Sewraj, N ^a   Gardou, J P ^a   Salamero, Y ^a   Millet, P ^a  

^a UNIVERSITÉ DE TOULOUSE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; BINARY MIXTURES; ELECTRON RESONANCE; ELECTRON TRANSITIONS; KRYPTON; LASER OPTICS; LIGHT ABSORPTION; MONTE CARLO METHODS; MULTIPHOTON PROCESSES; OPTICAL PUMPING; VAN DER WAALS FORCES; XENON;

RADIATION TRAPPING;

EXCIMER LASERS;

EID: 17744390349     PISSN: 10502947     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevA.62.052721     Document Type: Article

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