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Volumn 2, Issue , 2004, Pages 1896-1900
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Analysis of a borderless fab scenario in a distributed simulation testbed
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPETITION;
CONTROL SYSTEM ANALYSIS;
FUNCTIONS;
MATHEMATICAL MODELS;
SEMICONDUCTOR DEVICE MANUFACTURE;
SYNCHRONIZATION;
WORLD WIDE WEB;
BORDERLESS FAB SCENARIO;
DISTRIBUTED SIMULATION;
FAB MATERIAL FLOW;
MOORE'S LAWS;
COMPUTER SIMULATION;
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EID: 17744386010
PISSN: 08917736
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (10)
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References (8)
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