Formation and retention of low Σ interfaces in PTC thermistors

Acta Materialia

Volumn 53, Issue 9, 2005, Pages 2751-2758

  Seaton, J ^a   Leach, C ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Coincidence lattice; Electroceramics; Electron backscattering patterns; Interfaces

Indexed keywords

ANNEALING; BACKSCATTERING; CERAMIC MATERIALS; GRAIN BOUNDARIES; INTERFACES (MATERIALS); MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; THERMISTORS;

COINCIDENCE LATTICE; ELECTROCERAMICS; ELECTRON BACKSCATTERING PATTERNS; GRAIN DISTRIBUTION;

POSITIVE TEMPERATURE COEFFICIENT;

EID: 17744384328     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2005.02.036     Document Type: Article

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