X-ray powder diffraction and electron diffraction studies of the Ni 1±yGe1-xPx system

Journal of Solid State Chemistry

Volumn 178, Issue 3, 2005, Pages 742-754

  García García, F Javier ^a   Larsson, A K ^a,b  

^a STOCKHOLM UNIVERSITY   (Sweden)

^b AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

Displacive distortion; Electron diffraction; Modulated NiAs type structure; Ni Ge P ternary system; Superstructure; X ray powder diffraction

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; MOLECULAR STRUCTURE; STOICHIOMETRY; X RAY POWDER DIFFRACTION;

DISPLACIVE DISTORTION; MODULATED NIAS-TYPE STRUCTURE; NI-GE-P TERNARY SYSTEM; SUPERSTRUCTURE;

NICKEL COMPOUNDS;

GERMANIUM DERIVATIVE; MANGANESE; NICKEL COMPLEX; PHOSPHORUS DERIVATIVE;

ARTICLE; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; MOLECULAR DYNAMICS; MOLECULAR INTERACTION; PHASE TRANSITION; PURIFICATION; REACTION ANALYSIS; SPECTRAL SENSITIVITY; STOICHIOMETRY; STRUCTURE ANALYSIS; X RAY DIFFRACTION; X RAY POWDER DIFFRACTION;

EID: 17744382584     PISSN: 00224596     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jssc.2004.10.040     Document Type: Article

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