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Volumn , Issue , 2004, Pages 306-309

Electrical treeing studies on the Araldite LY/HY 5052 epoxy resin over a wide range of stressing voltage

Author keywords

[No Author keywords available]

Indexed keywords

AC MACHINERY; ELECTRIC CURRENTS; ELECTRIC INSULATION; EPOXY RESINS; FRACTALS; STRESS ANALYSIS; TEMPERATURE DISTRIBUTION; THERMOANALYSIS; VOLUME FRACTION;

EID: 17744380413     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (15)

References (6)
  • 2
    • 0000930541 scopus 로고
    • The effect of voltage and material age on the electrical tree growth and breakdown characteristics of epoxy resins
    • J. V. Champion and S. J. Dodd, "The effect of voltage and material age on the electrical tree growth and breakdown characteristics of epoxy resins," J. Phys. D: Appl. Phys. vol. 28, pp. 398-407, 1995.
    • (1995) J. Phys. D: Appl. Phys. , vol.28 , pp. 398-407
    • Champion, J.V.1    Dodd, S.J.2
  • 4
    • 17744377678 scopus 로고    scopus 로고
    • Thermodynamic model for electrical tree propagation kinetics in combined electrical and mechanical stresses
    • in press
    • H. -Z. Ding and B. R. Varlow, "Thermodynamic model for electrical tree propagation kinetics in combined electrical and mechanical stresses," IEEE Trans. on Dielectrics and Electrical Insulation, Vol. 11, 2004, in press.
    • (2004) IEEE Trans. on Dielectrics and Electrical Insulation , vol.11
    • Ding, H.Z.1    Varlow, B.R.2
  • 5
    • 0004699424 scopus 로고
    • Breakdown of solid dielectrics in divergent fields
    • J. H. Mason, "Breakdown of solid dielectrics in divergent fields", Proc. IEE., Vol. 102, pp. 254-63, 1955.
    • (1955) Proc. IEE. , vol.102 , pp. 254-263
    • Mason, J.H.1
  • 6
    • 0031247837 scopus 로고    scopus 로고
    • A molecular model to evaluate the impact of aging on space charge in polymer dielectrics
    • J. -P. Crine, "A molecular model to evaluate the impact of aging on space charge in polymer dielectrics," IEEE Trans. on Dielectrics and Electrical Insulation, Vol. 4, pp.487-495, 1997.
    • (1997) IEEE Trans. on Dielectrics and Electrical Insulation , vol.4 , pp. 487-495
    • Crine, J.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.