New PTB beamlines for high-accuracy EUV reflectometry at BESSY II

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4146, Issue 1, 2000, Pages 72-82

  Scholze, F ^a   Beckhoff, B ^a   Brandt, G ^a   Fliegauf, R ^a   Klein, R ^a   Meyer, B ^a   Rost, D ^a   Schmitz, D ^a   Veldkamp, M ^a   Weser, J ^a   Ulm, G ^a   Louis, E ^b   Yakshin, A E ^b   Oestreich, S ^b   Bijkerk, F ^b  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^b FOM INSTITUTE FOR PLASMA PHYSICS RIJNHUIZEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

MIRRORS; PHOTONS; REFLECTION; SYNCHROTRON RADIATION; ULTRAVIOLET RADIATION;

BEAMLINES; OPTICAL COMPONENTS;

REFLECTOMETERS;

EID: 17744377170     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.406678     Document Type: Article

References (0)