Three-dimensional measurement and defect detection based on single image

Journal of Optoelectronics and Advanced Materials

Volumn 7, Issue 2, 2005, Pages 1029-1038

  Song, L ^a   Qu, X ^a   Xu, K ^a   Lv, L ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

Defect; Detection of defects; Slant; Tilt; Tonal value

Indexed keywords

ERROR DETECTION; IMAGE QUALITY; IMAGING TECHNIQUES; OPTICAL SYSTEMS; PATTERN RECOGNITION; PHOTOGRAPHY;

DETECTION OF DEFECTS; SLANT; TILT; TONAL VALUE;

DEFECTS;

EID: 17744371651     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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