Simulating nanodielectric composites using the method of local fields

Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP

Volumn , Issue , 2004, Pages 310-313

  Kuehn, Markus ^a   Kliem, H ^a  

^a SAARLAND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIELECTRIC DEVICES; GRAIN BOUNDARIES; NANOSTRUCTURED MATERIALS; NUMERICAL ANALYSIS; PERMITTIVITY; PERSONAL COMPUTERS; THICKNESS MEASUREMENT;

ELECTRIC DIPOLE; IMAGE DIPOLES; NANODIELECTRICS; POLARIZABILITY;

ELECTRIC FIELD EFFECTS;

EID: 17744370305     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. rd edition, John Wiley & Sons, New York, 1998
2. H. Fröhlich, Theory of Dielectrics, Oxford: Oxford University Press, 1990.
3. N. Farag and H. Kliem, "Interactions in Point-Dipole Systems: Effects of Size, Electrodes, and Lattice Defects", Phys. Stat. Sol. (b), vol. 233, No. 1, pp. 180-187, 2002.