Radiation-hard optoelectronic data readout for the ATLAS SCT

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4134, Issue 1, 2000, Pages 214-221

  Troska, J ^a   Dowell, J D ^b   Gregor, I M ^c   Homer, R J ^b   Jovanovic, P ^b   Mahout, G ^b   Mandic, I ^d   Wastie, R ^e   Weidberg, A R ^e   White, D J ^a  

^a RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^b UNIVERSITY OF BIRMINGHAM   (United Kingdom)

^c UNIVERSITY OF WUPPERTAL   (Germany)

^d JO EF STEFAN INSTITUTE   (Slovenia)

^e UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

ASIC; ATLAS; Data link; High energy physics; lifetesting; Optical link; PIN photodiode; Radiation effects; Single Event Upset; VCSEL

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; COLLIDING BEAM ACCELERATORS; DOSIMETRY; GAMMA RAYS; HIGH ENERGY PHYSICS; NEUTRON IRRADIATION; OPTICAL LINKS; PHOTODIODES; RADIATION EFFECTS;

LARGE HADRON COLLIDERS (LHC); SEMICONDUCTOR TRACKERS (SCT);

SEMICONDUCTOR LASERS;

EID: 17744365159     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.405346     Document Type: Article

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