Frequency domain tests for residual serial correlation

Oxford Bulletin of Economics and Statistics

Volumn 59, Issue 4, 1997, Pages 549-567

  Choi, In ^a   Mark, Nelson ^a  

^a NONE

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EID: 17744363155     PISSN: 03059049     EISSN: None     Source Type: Journal    
DOI: 10.1111/1468-0084.00082     Document Type: Article

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