Changes in spectral response with temperature and irradiance intensity

Thin Solid Films

Volumn 451-452, Issue , 2004, Pages 145-151

  Mullejans H ^a   Wagner, T ^b   Merli, F ^a   Jager Waldau A ^a   Dunlop, E D ^a  

^a JOINT RESEARCH CENTRE   (Italy)

^b MUNICH UNIVERSITY OF APPLIED SCIENCES   (Germany)

Author keywords

A Si; Characterisation; CIS; Photoelectric properties; Spectral response

Indexed keywords

BANDWIDTH; CHARACTERIZATION; MATRIX ALGEBRA; PHOTOELECTRICITY; SILICON; SPECTRUM ANALYZERS;

PHOTOELECTRIC PROPERTIES; SPECTRAL RESPONSE;

THIN FILMS;

EID: 17644445234     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.11.006     Document Type: Conference Paper

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2. IEC 60904-7, Computation of spectral mismatch error introduced in the testing of a photovoltaic device, 1998.
3. H. Bossong, Temperature and bias light dependence of spectral response measurements of solar cells, Diploma Thesis, FH Trier, 2002.
4. H. Müllejans, H. Bossong, E.D. Dunlop, Temperature and bias light dependence of SR measurements, Proceedings of the PV in Europe Conference, Rome, 2002, p. 891.
5. D. Willet, S. Kuriyagawa, The effects of sweep rate, voltage bias and light soaking on the measurement of CIS-based solar cell characteristics, Proceedings of the 23rd IEEE PVSC Conference, 1993, p. 495.