Electronic properties of chemically etched CdTe thin films: Role of Te for back-contact formation

Materials Research Society Symposium - Proceedings

Volumn 668, Issue , 2001, Pages H751-H756

  Kraft, D ^a   Thissen A ^a   Campo, M ^b   Beerbom, M ^a   Mayer, T ^a   Klein, A ^a   Jaegermann, W ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^b ANTEC Solar GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ETCHING; FERMI LEVEL; METALLIZING; PHASE TRANSITIONS; POLYCRYSTALLINE MATERIALS; POROUS MATERIALS; SCHOTTKY BARRIER DIODES; SEMICONDUCTING CADMIUM TELLURIDE; SOLAR CELLS; X RAY DIFFRACTION ANALYSIS;

ELECTRIC BACK CONTACTS;

THIN FILMS;

EID: 17644444896     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: 10.1557/proc-668-h7.5     Document Type: Article

References (13)