Influence of surface treatments on nanocrystalline silicon

Thin Solid Films

Volumn 451-452, Issue , 2004, Pages 375-378

  Mandal, N P ^a   Dey, S ^a   Agarwal, S C ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

Author keywords

Atomic force microscopy; Photoluminescence; Porous Silicon

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARGE COUPLED DEVICES; IONIZATION; PHOTOLUMINESCENCE; POROUS SILICON; QUANTUM THEORY; SINGLE CRYSTALS; SURFACE TREATMENT; X RAY DIFFRACTION ANALYSIS;

DEIONIZATION; NANOCRYSTALLINE SILICON;

NANOSTRUCTURED MATERIALS;

EID: 17644437713     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.11.068     Document Type: Conference Paper

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