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Volumn 212-213, Issue SPEC., 2003, Pages 711-714

c(4 × 8) periodicity in ultrathin iron silicides on Si(1 1 1)

Author keywords

Iron silicide; LEED; Scanning tunnelling microscopy; Structure; Surface; Thin films

Indexed keywords

ANNEALING; COMPOSITION; IRON COMPOUNDS; LOW ENERGY ELECTRON DIFFRACTION; MICROELECTRONICS; PHASE TRANSITIONS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SURFACE STRUCTURE;

EID: 17644433015     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(03)00084-9     Document Type: Conference Paper
Times cited : (9)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.