|
Volumn 212-213, Issue SPEC., 2003, Pages 711-714
|
c(4 × 8) periodicity in ultrathin iron silicides on Si(1 1 1)
|
Author keywords
Iron silicide; LEED; Scanning tunnelling microscopy; Structure; Surface; Thin films
|
Indexed keywords
ANNEALING;
COMPOSITION;
IRON COMPOUNDS;
LOW ENERGY ELECTRON DIFFRACTION;
MICROELECTRONICS;
PHASE TRANSITIONS;
SCANNING TUNNELING MICROSCOPY;
SEMICONDUCTING SILICON;
SURFACE STRUCTURE;
SOLID PHASE EPITAXY (SPE);
ULTRATHIN FILMS;
|
EID: 17644433015
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(03)00084-9 Document Type: Conference Paper |
Times cited : (9)
|
References (17)
|