ASIC-based event-driven 2D digital electron counter for TEM imaging

Ultramicroscopy

Volumn 70, Issue 3, 1998, Pages 107-113

  Fan, G Y ^a   Datte, P ^b   Beuville, E ^c   Beche, J F ^c   Millaud, J ^c   Downing, K H ^c   Burkard, F T ^c   Ellisman, M H ^a   Xuong, N H ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

ASIC; CCD; Digital imaging; Electron detection; Event driven detector; TEM

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CHARGE COUPLED DEVICES; IMAGING SYSTEMS; READOUT SYSTEMS; TRANSMISSION ELECTRON MICROSCOPY;

DIGITAL ELECTRON COUNTER;

RADIATION COUNTERS;

ARTICLE; DEVICE; ELECTRON CAPTURE DETECTION; IMAGING SYSTEM; TECHNIQUE; TRANSMISSION ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY;

EID: 17644432461     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00109-5     Document Type: Article

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