Orientation of cavitands at air/water and air/solid interfaces studied by second harmonic generation

Chemical Physics Letters

Volumn 381, Issue 3-4, 2003, Pages 322-328

  Lagugne Labarthet F ^a   Yu, T ^a   Barger, W R ^b   Shenoy, D K ^b   Dalcanale, E ^c   Shen, Y R ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

^c UNIVERSITY OF PARMA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON DIOXIDE; SURFACTANT; WATER;

ANALYTIC METHOD; ARTICLE; COMPRESSION; DENSITY; FILM; MOLECULE;

EID: 17644431776     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cplett.2003.09.090     Document Type: Article

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