Orientation of perylene derivatives on semiconductor surfaces

Applied Surface Science

Volumn 212-213, Issue SPEC., 2003, Pages 501-507

  Kampen, T U ^a   Salvan, G ^a   Paraian, A ^a   Himcinschi, C ^a   Kobitski, A Yu ^a   Friedrich, M ^a   Zahn, D R T ^a  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Optical anisotropy; Organic films; PTCDA; Structural properties

Indexed keywords

ABSORPTION SPECTROSCOPY; ANISOTROPY; MOLECULAR ORIENTATION; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR MATERIALS; SUBSTRATES; SURFACE PHENOMENA; THIN FILMS; X RAY ANALYSIS;

OPTICAL ANISOTROPY;

ORGANIC COMPOUNDS;

EID: 17644428786     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(03)00390-8     Document Type: Conference Paper

References (16)

1. Umbach E., Glöckner K., Sokolowski M. Surf. Sci. 402-404:1998;20.
2. Schmitz-Hübsch T., Fritz T., Sellam F., Straub R., Leo K. Phys. Rev. B. 55:1997;7972.
3. Kendrick C., Kahn A., Forrest S.R. Appl. Surf. Sci. 104/105:1996;586.
4. Seidel C., Poppensieker J., Fuchs H. Surf. Sci. 408:1998;223.
5. Kendrick C., Kahn A. J. Cryst. Growth. 181:1997;181.
6. Hirose Y., Forrest S.R., Kahn A. Phys. Rev. B. 52:1995;14040.
7. Kampen T.U., Salvan G., Tenne D., Zahn D.R.T. Appl. Surf. Sci. 175-176:2001;326.
8. Nowakowski R., Seidel C., Fuchs H. Phys. Rev. B. 63:2001;195418.
9. Yanagi H., Toda Y., Noguchi T. Jpn. J. Appl. Phys. 34:1995;3808.
10. T.U. Kampen, D.R.T. Zahn, W. Braun, C. Gonzáles, I. Benito, J. Ortega, L. Jurczyszyn, J.M. Blanco, R. Pérez, F. Flores Appl. Surf. Sci., this volume.
11. Gaussian 98 (Revision A.1), M.J. Frisch, G.W. Trucks, H.B. Schlegel, G.E. Scuseria, M.A. Robb, J.R. Cheeseman, V.G. Zakrzewski, J.A. Montgomery, R.E. Stratmann, J.C. Burant, S. Dapprich, J.M. Millam, A.D. Daniels, K.N. Kudin, M.C. Strain, O. Farkas, J. Tomasi, V. Barone, M. Cossi, R. Cammi, B. Mennucci, C. Pomelli, C. Adamo, S. Clifford, J. Ochterski, G.A. Petersson, P.Y. Ayala, Q. Cui, K. Morokuma, D.K. Malick, A.D. Rabuck, K. Raghavachari, J.B. Foresman, J. Cioslowski, J.V. Ortiz, B.B. Stefanov, G. Liu, A. Liashenko, P. Piskorz, I. Komaromi, R. Gomperts, R.L. Martin, D.J. Fox, T. Keith, M.A. Al-Laham, C.Y. Peng, A. Nanayakkara, C. Gonzalez, M. Challacombe, P.M.W. Gill, B.G. Johnson, W. Chen, M.W. Wong, J.L. Andres, M. Head-Gordon, E.S. Replogle, J.A. Pople, Gaussian, Inc., Pittsburgh PA, 1998.
12. R.M.A. Azzam, N.M. Bashara, Ellipsometry and Polarized Light, North - Holland Amsterdam, 1997.
13. Aroca R., Jennings C., Loutfy R.O., Hor A.M. J. Phys. Chem. 90:1986;5255.
14. Kampen T.U., Paraian A.M., Rossow U., Park S., Salvan G., Friedrich M., Zahn D.R.T. Phys. Stat. Sol. 181:2001;1307.
15. Kaiser R., Friedrich M., Schmitz-Hübsch T., Sellam F., Kampen T.U., Leo K., Zahn D.R.T. Fresenius J. Anal. Chem. 363:1999;189.
16. Bulovic V., Burrows P.E., Forrest S.R., Cronin J.A., Thompson M.E. Chem. Phys. 210:1996;1.