Small prototype of Anger camera with submillimeter position resolution

Review of Scientific Instruments

Volumn 76, Issue 4, 2005, Pages

  Fiorini, Carlo ^a,b   Perotti, Francesco ^c  

^a POLITECNICO DI MILANO   (Italy)

^b INFN SEZIONE DI MILANO   (Italy)

^c INAF IASF MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ANGER CAMERAS; ELECTRONIC NOISE; SILICON DRIFT DETECTORS (SDD); SINGLE PHOTON EMISSION COMPUTER TOMOGRAPHY (SPECT);

AVALANCHE DIODES; COMPUTERIZED TOMOGRAPHY; DETECTORS; FIELD EFFECT TRANSISTORS; GAMMA RAYS; MEDICAL IMAGING; PHOTODETECTORS; PHOTOMULTIPLIERS; POSITION MEASUREMENT; POSITRON EMISSION TOMOGRAPHY; SINGLE CRYSTALS;

CAMERAS;

EID: 17644426641     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1891485     Document Type: Article

References (11)

1. H. O. Anger, Rev. Sci. Instrum. 29, 27 (1958).
2. F. J. Beekman, Eur. J. Nucl. Med. 29, 933 (2002).
3. B. E. Patt, IEEE Trans. Nucl. Sci. 45, 2126 (1998).
4. K. S. Shah, IEEE Trans. Nucl. Sci. 48, 2352 (2001).
5. C. Fiorini, IEEE Trans. Nucl. Sci. 44, 2553 (1997).
6. P. Lechner, Nucl. Instrum. Methods Phys. Res. A 458, 281 (2001).
7. C. Fiorini, F. Perotti, and C. Labanti, Rev. Sci. Instrum. 71, 2979 (2000).
8. C. Fiorini, IEEE Trans. Nucl. Sci. 48, 346 (2001).
9. C. Fiorini, Nucl. Instrum. Methods Phys. Res. A 512, 265 (2003).
10. C. Fiorini, A. Longoni, and P. Lechner, IEEE Trans. Nucl. Sci. 47, 1691 (2000).
11. E. V. D. van Loef, Appl. Phys. Lett. 79, 1573 (2001).