Three-dimensional shape sensor based on lateral focused-plane sectioning

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5602, Issue , 2004, Pages 99-106

  Ishii, Akira ^a   Mitsudo, Jun ^a   Fujinaka, Yuuka ^a  

^a RITSUMEIKAN UNIVERSITY   (Japan)

Author keywords

Focus measure; Shape from focus; Three dimensional shape measurement

Indexed keywords

CONTOUR DETECTION; LIGHT PLANE SECTIONING; SHAPE FROM FOCUS; THREE DIMENSIONAL SHAPE MEASUREMENT;

CHARGE COUPLED DEVICES; ELECTRONICS PACKAGING; LSI CIRCUITS; MICROELECTRONICS; OPTICAL SYSTEMS; THREE DIMENSIONAL COMPUTER GRAPHICS;

IMAGE SENSORS;

EID: 17644421451     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.571320     Document Type: Conference Paper

References (5)

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5. R. A. Jarvis, "Focus optimization criteria for computer image processing," Microscope, Vol. 24, No. 2, pp. 163-180, 1976.