Characteristics of waveguide photodetectors at high-power optical input

IEEE Photonics Technology Letters

Volumn 17, Issue 4, 2005, Pages 881-883

  Choe, Joong Seon ^a   Kwon, Yong Hwan ^a   Kim, Kisoo ^a  

^a Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

Author keywords

Optical confinement factor; Photodetector (PD); Quantum well; Reliability; Saturated output

Indexed keywords

DRY ETCHING; LIGHT ABSORPTION; OPTICAL FIBERS; OPTICAL WAVEGUIDES; PHOTOCURRENTS; PHOTOLITHOGRAPHY; RELIABILITY; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR QUANTUM WELLS;

OPTICAL CONFINEMENT FACTOR; SATURATED OUTPUT; WAVEGUIDE PHOTODETECTORS;

PHOTODETECTORS;

EID: 17644378717     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2005.844003     Document Type: Article

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