Electron excitation in glasses and sapphire followed by time- and space-measuring tools

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5620, Issue , 2004, Pages 239-244

  Kreutz, E W ^a,b   Horn, A ^a   Poprawe, R ^a,b  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b FRAUNHOFER INSTITUTE FOR LASER TECHNOLOGY   (Germany)

Author keywords

Fs and ps laser radiation; Glasses; Interaction phenomena; Microstructuring; Modification; Sapphire

Indexed keywords

BANDWIDTH; FUSED SILICA; GLASS; HIGH SPEED PHOTOGRAPHY; LASER PULSES; LIGHT ABSORPTION; MICROSTRUCTURE; REFRACTIVE INDEX; SAPPHIRE;

FEMTOSECOND (FS)- AND PICOSECOND (PS)-LASER RADIATION; INTERACTION PHENOMENA; LASER RADIATIONS; MICROSTRUCTURING;

LASER BEAM EFFECTS;

EID: 17644377232     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.580747     Document Type: Conference Paper

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