Demonstration of a low-cost 1625-nm OTDR monitoring for 350-km WDM networks with semiconductor optical amplifiers

IEEE Photonics Technology Letters

Volumn 17, Issue 4, 2005, Pages 852-854

  Lee, H H ^a   Nam, Y H ^a   Lee, D ^a   Chung, H S ^b   Kim, K ^b  

^a Chungnam National University   (South Korea)

^b Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

Author keywords

1625 nm; Optical time domain reflectometry (OTDR); Semiconductor optical amplifier (SOA)

Indexed keywords

BANDPASS FILTERS; BANDWIDTH; BIT ERROR RATE; LIGHT TRANSMISSION; MONITORING; OPTICAL LINKS; RAYLEIGH SCATTERING; REFLECTOMETERS; SINGLE MODE FIBERS; WAVELENGTH DIVISION MULTIPLEXING;

OPTICAL TIME DOMAIN REFLECTOMETRY (OTDR); SEMICONDUCTOR OPTICAL AMPLIFIER;

LIGHT AMPLIFIERS;

EID: 17644376543     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2004.843280     Document Type: Article

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