Instruments for automatic test

IEEE Instrumentation and Measurement Magazine

Volumn 8, Issue 1, 2005, Pages 27-34

  Truebenbach, Eric ^a  

^a TERADYNE INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; DIGITAL INSTRUMENTS; INSTRUMENT CIRCUITS; INTEROPERABILITY; SEMICONDUCTOR DEVICE TESTING;

AUTOMATIC TEST EQUIPMENT; PROGRAMMABLE INSTRUMENTATION; UNIT UNDER TEST;

AUTOMATIC TESTING;

EID: 17644375135     PISSN: 10946969     EISSN: None     Source Type: Journal    
DOI: 10.1109/MIM.2005.1405921     Document Type: Article

References (8)

1. IEEE Standard Codes, Formats, Protocols, and Common Commands for Use with IEEE Std 488.1-1987, IEEE Standard Digital Interface for Programmable Instrumentation. ANSI/IEEE Std. 488.2-1992/IEC60625.2, June 18,1992.
2. A. Patel, "Eight ways to increase GPIB system performance," Nat. Instrum. Corp., Austin, TX, Appl. Note 133, Nov. 1988.
3. S. Elbert, et al. "Gigabit Ethernet and low-cost supercomputing," Ames Lab., Ames, IA, Tech. Rep. IS-5126, Nov. 1997.
4. Higher Performance Protocol for the Standard Digital Interface for Programmable Instrumentation, ANSI/IEEE Std 488.1-2003/IEC60625.1, June 12, 2003
5. F. Blönningen, "What is the ideal bus?," Eval. Eng., Mar. 2001.
6. A Versatile Backplane Bus: VMEbus, ANSI/IEEE Std 1014-1987, March 12,1987.
7. PCI Local Bus Specification Rev 3.0, PCI-SIG 2004, Feb. 3, 2004.
8. E. Truebenbach, "High performance digital testing in a VXI backplane," in Proc. IEEE Systems Readiness Technology Conf., 1997 [Online]. Available: http://www.teradyne.com/prods/cbt/ products/library/m9s/wp_atc97_truebenbach.pdf