Spectroscopic analysis of signals from LIBS experiments

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5622, Issue PART 3, 2004, Pages 1037-1042

  D'Angelo, C ^a   Pace, D Diaz ^a   Bertuccelli, D ^a   Bertuccelli, G ^a  

^a University fo Buenos Aires   (Argentina)

Author keywords

Analytical Spectroscopy; Laser; Plasma

Indexed keywords

ANALYTICAL SPECTROSCOPY; ATOMIC LINES; ELECTRONIC TEMPERATURES; OPTICAL THICKNESS;

ABSORPTION; ATMOSPHERIC PRESSURE; ERROR ANALYSIS; LASER APPLICATIONS; PARAMETER ESTIMATION; PLASMAS; SIGNAL PROCESSING; THICKNESS MEASUREMENT; TRACE ELEMENTS;

SPECTROSCOPIC ANALYSIS;

EID: 17644374090     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.591209     Document Type: Conference Paper

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