A high-temperature diffraction study of the solid solution CaTiOSiO4-CaTiOGeO4

American Mineralogist

Volumn 90, Issue 8-9, 2005, Pages 1325-1334

  Ellemann Olesen, Rikke ^a   Malcherek, Thomas ^a  

^a UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LATTICE CONSTANTS; SEMICONDUCTOR ALLOYS; SI-GE ALLOYS; SILICON; SINGLE CRYSTALS; X RAY POWDER DIFFRACTION;

DIFFUSE SCATTERING; HIGH TEMPERATURE; HIGH TEMPERATURE DIFFRACTION; SINGLE CRYSTAL X-RAY DIFFRACTION; SPONTANEOUS STRAIN; STRUCTURAL PHASE TRANSITION; SUPERSTRUCTURE REFLECTIONS; TRICRITICAL BEHAVIOR;

SOLID SOLUTIONS;

PHASE TRANSITION; SOLID SOLUTION; TITANITE; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION;

EID: 17644370142     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am.2005.1729     Document Type: Article

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