|
Volumn 130-132, Issue , 1998, Pages 629-638
|
Ultrabright synchrotron radiation applied to the characterization and control of interfaces
a a a a a a a
a
EPFL
(Switzerland)
|
Author keywords
[No Author keywords available]
|
Indexed keywords
PHOTOEMISSION;
SPECTROSCOPY;
SYNCHROTRON RADIATION;
X RAYS;
SPECTROMICROSCOPY;
X RAY IMAGING;
INTERFACES (MATERIALS);
|
EID: 17544393991
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(98)00127-5 Document Type: Article |
Times cited : (4)
|
References (18)
|