Reconstruction of Stress and Composition Profiles from X-Ray Diffraction Experiments How to Avoid Ghost Stresses?

Materials Science Forum

Volumn 443-444, Issue , 2004, Pages 91-94

  Christiansen, Thomas ^a   Somers, Marcel A J ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Depth Profiling; Residual Stress; Successive Layer Removal; X Ray Diffraction

Indexed keywords

COMPUTER SIMULATION; CRYSTAL LATTICES; ELASTIC MODULI; GAUSSIAN NOISE (ELECTRONIC); POLYNOMIALS; REGRESSION ANALYSIS; RESIDUAL STRESSES; STRAIN; X RAY DIFFRACTION ANALYSIS;

DEPTH PROFILING; SUCCESSIVE LAYER REMOVAL;

STRESS ANALYSIS;

EID: 17544393462     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.443-444.91     Document Type: Conference Paper

References (4)

1. B. Eigenmann, B. Scholtes and E. Macherauch, in: H. Fujiwara, T. Abe, K. Tanaka (Hrsg.): Residual Stresses -III, Science and Technology (Elsevier Applied Science London, New York 1992), p. 601
2. M.A.J. Somers and E.J. Mittemeijer: Metallurgical Transactions A Vol. 21A (1990) p. 189
3. W.G. Sloof, M.A.J. Somers, R. Delhez, Th. H. de Keijser and E.J. Mittemeijer: Residual Stresses in Science and Technology (1987), p. 493
4. G.A.F. Seber and C.J. Wild: Nonlinear Regression (John Wiley & Sons 1989).