XPS and IR characterization of manganese ions deposited on alumina

Journal of Molecular Structure

Volumn 482-483, Issue , 1999, Pages 19-22

  Kantcheva, M ^a   Kucukkal, M U ^a   Suzer, S ^a  

^a BILKENT UNIVERSITY   (Turkey)

Author keywords

FTIR of adsorbed CO; Manganese on alumina; XPS

Indexed keywords

ALUMINUM OXIDE; CARBON MONOXIDE; MANGANESE;

ADSORPTION; CONFERENCE PAPER; INFRARED SPECTROSCOPY; ION EXCHANGE; OXIDATION; ROENTGEN SPECTROSCOPY; STRUCTURE ANALYSIS; SYNTHESIS;

EID: 17544389969     PISSN: 00222860     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-2860(98)00834-5     Document Type: Conference Paper

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