On the origin of the high resistance to coarsening of Ω plates in Al-Cu-Mg-(Ag) alloys using Z-contrast microscopy

Materials Science Forum

Volumn 331-337 II, Issue , 2000, Pages 965-970

  Hutchinson, C R ^a,b   Fan, X ^c,d   Pennycook, S J ^d   Shiflet, Gary J ^b  

^a MONASH UNIVERSITY   (Australia)

^b University of Virginia   (United States)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

^d UNIVERSITY OF KENTUCKY   (United States)

Author keywords

Coarsening; Interfacial Segregation; Ledges; Precipitation; Z Contrast

Indexed keywords

ACTIVATION ENERGY; CRYSTAL GROWTH; INTERFACES (MATERIALS); INTERFACIAL ENERGY; NUCLEATION; PHASE TRANSITIONS; THERMAL EFFECTS; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY;

ALUMINUM COPPER MAGNESIUM SILVER ALLOYS; ATOMIC RESOLUTION Z-CONTRAST MICROSCOPY; THICKENING KINETICS;

ALUMINUM ALLOYS;

EID: 17544379919     PISSN: 02555476     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.331-337.965     Document Type: Article

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