Electron-beam induced current profiles for thin film heterojunction analysis

Solid State Phenomena

Volumn 51-52, Issue , 1996, Pages 527-532

  Scheer, R ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

Back Surface Recombination; Collection Efficiency; Diffusion Length; EBIC; Solar Cell

Indexed keywords

EID: 17544376740     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/ssp.51-52.527     Document Type: Article

References (8)

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3. C.J. Wu and D.B. Wittry, J .Appl.Phys. 49, 2827 (1978).
4. B. Akamatsu, J. Henoc and P. Henoc, J.Appl.Phys. 52, 7245 (1981).
5. R. Scheer, T. Walter, H.W. Schock, M.L. Fearheiley and H.J. Lewerenz, Appl. Phys. Lett. 63, 3294 (1993).
6. L. Stolt, M. Bodegård, J. Hedström, J. Kessler, M.Ruckh, K.-O. Velthaus and H.W. Schock, in Proceedings of the 11th E. C. Photovoltaic Specialists Conference, Montreux (Harwood Academic, 1992), p. 120
7. R. Scheer, unpublished results (1993)
8. D. Schmid, M. Ruckh and H.W. Schock, in Proceedings of the 1st World Photovoltaic Solar Energy Conference, Hawaii (IEEE, 1994), p.198