Reconstruction of the recombination centre distribution in dislocation impurity atmosphere in Si

Solid State Phenomena

Volumn 51-52, Issue , 1996, Pages 123-128

  Bondarenko, I ^a   Kononchuk, O ^a   Sirotkin, V ^a  

^a RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

Author keywords

Dislocations; EBIC; Infrared Beam Induced Current; Point Defects

Indexed keywords

EID: 17544372294     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/ssp.51-52.123     Document Type: Article

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4. Boglaev, and V. Sirotkin, in Application of Advanced Computational Method for Boundary and Interior Layers, ed. by J.J.H. Miller, (Boole Press, Dublin 1993), pp. 1-32
5. C. Donolato, phys. stat. sol. (a) 65, 649 (1981)
6. H. Fitting, H. Glaefeke, and W. Wild, phys. stat sol. (a) 43, 1199 (1985)