Polycrystalline Silicon on Glass Substrates for Thin Film Solar Cells

Solid State Phenomena

Volumn 51-52, Issue , 1996, Pages 515-520

  Bergmann, R ^a   Oswald, G ^b   Albrecht, M ^b   Werner, J H ^a  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^b UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

Disilane; Glass Substrates; Grain Size; In Situ Crystallization Monitoring; Low Pressure Chemical Vapour Deposition; Solar Cells; Solid Phase Crystallization; Transmission Electron Microscopy

Indexed keywords

EID: 17544363547     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/ssp.51-52.515     Document Type: Article

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