Characterization of surface nanostructures by STM light emission spectroscopy

Applied Surface Science

Volumn 113-114, Issue , 1997, Pages 335-342

  Ushioda, S ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Coulomb blockade; Nanostructures; Porous Si; STM light emission

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRON TUNNELING; EMISSION SPECTROSCOPY; GOLD; LIGHT EMISSION; POROUS SILICON; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE;

COULOMB BLOCKADE; SINGLE ELECTRON CHARGING EFFECT;

NANOSTRUCTURED MATERIALS;

EID: 17444452252     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)00897-5     Document Type: Article

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