Stability degradation factors evaluated by phase noise measurement in an optical-microwave frequency link using an optical frequency comb

IEEE Transactions on Instrumentation and Measurement

Volumn 54, Issue 2, 2005, Pages 763-766

  Inaba, Hajime ^a   Yanagimachi, Shinya ^a   Hong, Feng Lei ^a   Onae, Atsushi ^a   Koga, Yasuki ^a   Matsumoto, Hirokazu ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Laser stability; Mode locked lasers; Phase noise

Indexed keywords

FREQUENCIES; FREQUENCY SYNTHESIZERS; LASER MODE LOCKING; MICROWAVE MEASUREMENT; OPTICAL LINKS; PHOTODETECTORS; PIEZOELECTRIC TRANSDUCERS; SPURIOUS SIGNAL NOISE;

LASER STABILITY; NOISE MEASUREMENT; OPTICAL FREQUENCY COMB; OPTICAL-MICROWAVE FREQUENCY LINK; PHASE NOISE;

OPTICAL VARIABLES MEASUREMENT;

EID: 17444430302     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2004.843113     Document Type: Article

References (11)

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