Accuracy of an atomic microwave power standard

IEEE Transactions on Instrumentation and Measurement

Volumn 54, Issue 2, 2005, Pages 692-695

  Paulusse, Davic C ^a   Rowell, Nelson L ^a   Michaud, Alain ^a  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

Atomic measurements; Cooling; Laser cooling; Microwave measurements

Indexed keywords

ELECTRIC NETWORK ANALYZERS; ELECTROMAGNETIC FIELD EFFECTS; FREQUENCY RESPONSE; INSERTION LOSSES; LASERS; MICROWAVE MEASUREMENT; OPTICS; RADIATION EFFECTS; SPURIOUS SIGNAL NOISE; WAVEGUIDES;

ATOMIC MEASUREMENTS; LASER COOLING; MICROWAVE POWER STANDARD; VECTOR NETWORK ANALYZER; WAVEGUIDE TRANSMISSION LINE;

ELECTRIC POWER MEASUREMENT;

EID: 17444424892     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2005.843537     Document Type: Article

References (7)

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