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Volumn 26, Issue 7, 2005, Pages 943-952

On optimal reject rules and ROC curves

Author keywords

Chow's rejection rule; Derivative of ROC curves; Optimal decision rule; Rejection threshold; Supervised classification

Indexed keywords

COST EFFECTIVENESS; DECISION MAKING; DECISION THEORY; ERROR ANALYSIS; FUNCTIONS; VECTORS;

EID: 17444422546     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patrec.2004.09.042     Document Type: Article
Times cited : (48)

References (10)
  • 1
    • 77956889283 scopus 로고
    • Separate sample logistic discrimination
    • J.A. Anderson Separate sample logistic discrimination Biometrika 59 1972 19 35
    • (1972) Biometrika , vol.59 , pp. 19-35
    • Anderson, J.A.1
  • 3
    • 84937744538 scopus 로고
    • An optimum character recognition using decision functions
    • C.K. Chow An optimum character recognition using decision functions IRE Trans. Electron. Comput. 6 1957 247 254
    • (1957) IRE Trans. Electron. Comput. , vol.6 , pp. 247-254
    • Chow, C.K.1
  • 4
    • 0014710323 scopus 로고
    • On optimum recognition error and reject tradeoff
    • C.K. Chow On optimum recognition error and reject tradeoff IEEE Trans. Information Theory 16 1970 41 46
    • (1970) IEEE Trans. Information Theory , vol.16 , pp. 41-46
    • Chow, C.K.1
  • 5
    • 0742306126 scopus 로고    scopus 로고
    • Enhanced model-based clustering, density estimation, and discriminant analysis software: MCLUST
    • C. Fraley, and A.E. Raftery Enhanced model-based clustering, density estimation, and discriminant analysis software: MCLUST J. Classification 20 2003 263 286
    • (2003) J. Classification , vol.20 , pp. 263-286
    • Fraley, C.1    Raftery, A.E.2
  • 7
    • 84877772474 scopus 로고    scopus 로고
    • An optimal reject rule for binary classifiers
    • F.J. Ferri Advances in Pattern Recognition: Joint IAPR International Workshops, SSPR 2000 and SPR 2000 Springer-Verlag Heidelberg*et al.
    • F. Tortorella An optimal reject rule for binary classifiers F.J. Ferri Advances in Pattern Recognition: Joint IAPR International Workshops, SSPR 2000 and SPR 2000 Lecture Notes in Computer Science vol. 1876 2000 Springer-Verlag Heidelberg 611 620
    • (2000) Lecture Notes in Computer Science , vol.1876 , pp. 611-620
    • Tortorella, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.