Phase analysis of coaxial short and open circuits

IEEE Transactions on Instrumentation and Measurement

Volumn 54, Issue 2, 2005, Pages 701-704

  Kang, Jin Seob ^a   Kim, Jeong Hwan ^a   Kim, Dae Chan ^a  

^a Korea Research Institute of Standards and Science   (South Korea)

Author keywords

Impedance measurements; Impedance standards; Open circuits; Short circuits

Indexed keywords

BOUNDARY CONDITIONS; CALIBRATION; ELECTRIC NETWORK ANALYZERS; EQUIVALENT CIRCUITS; FOURIER TRANSFORMS; REFLECTOMETERS; SHORT CIRCUIT CURRENTS; TRANSMISSION LINE THEORY;

MODE MATCHING METHOD; OPEN CIRCUITS; PHASE ANALYSIS;

ELECTRIC IMPEDANCE MEASUREMENT;

EID: 17444419652     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2004.843335     Document Type: Article

References (8)

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