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Volumn 15, Issue 2, 2005, Pages 203-209

Constitutive relations for nonlinear modeling of Si/SiGe HBTs using an ANN model

Author keywords

Hetro junction bipolar transistor; Large signal; Microwave transistor; Neural network; Nonlinear modeling

Indexed keywords

HARMONIC ANALYSIS; MATHEMATICAL MODELS; MICROWAVE DEVICES; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; NEURAL NETWORKS; NONLINEAR SYSTEMS; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SIMULATORS;

EID: 17444418665     PISSN: 10964290     EISSN: None     Source Type: Journal    
DOI: 10.1002/mmce.20069     Document Type: Article
Times cited : (19)

References (9)
  • 4
    • 0036067718 scopus 로고    scopus 로고
    • "The smoothie" data model for the correct modeling of nonlinear distortion in FET devices
    • V. Cuoco, M.P. v.d. Heijden, and L.C.N. de Vreede, "The smoothie" data model for the correct modeling of nonlinear distortion in FET devices, IEEE MTT-S Int Microwave Symp Dig (2002), 2149-2151.
    • (2002) IEEE MTT-S Int Microwave Symp Dig , pp. 2149-2151
    • Cuoco, V.1    Heijden, M.P.V.D.2    De Vreede, L.C.N.3
  • 5
    • 0026395570 scopus 로고
    • Technology-independent large-signal nonquasi-static FET models by direct construction from automatically characterized device data
    • Stuttgart, Germany
    • st Euro Microwave Conf, Stuttgart, Germany, 1991, pp. 927-932.
    • (1991) st Euro Microwave Conf , pp. 927-932
    • Root, D.E.1    Fan, S.2    Meyer, J.3
  • 8
    • 0035679940 scopus 로고    scopus 로고
    • A robust algorithm for automatic development of neural network models for microwave applications
    • V. Devabhaktuni, M. Yagoub, and Q.J. Zhang, A robust algorithm for automatic development of neural network models for microwave applications, IEEE Trans Microwave Theory Tech 49 (2001), 2282-2291.
    • (2001) IEEE Trans Microwave Theory Tech , vol.49 , pp. 2282-2291
    • Devabhaktuni, V.1    Yagoub, M.2    Zhang, Q.J.3
  • 9
    • 0029210706 scopus 로고
    • Accurate on-wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device
    • Orlando, FL
    • J. Verspecht, P. Debie, A. Barel, and L. Martens, Accurate on-wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device, Conf Rec IEEE Microwave Theory Tech Symp, Orlando, FL, 1995, pp. 1029-1032.
    • (1995) Conf Rec IEEE Microwave Theory Tech Symp , pp. 1029-1032
    • Verspecht, J.1    Debie, P.2    Barel, A.3    Martens, L.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.