The plane-grating monochromator beamline at the U55 undulator for surface and interface studies at DELTA

Journal of Electron Spectroscopy and Related Phenomena

Volumn 144-147, Issue , 2005, Pages 1117-1123

  Westphal, C ^a   Berges, U ^a   Dreiner, S ^a   Follath, R ^b   Krause, M ^a   Schafers F ^b   Schirmer, D ^a   Schurmann M ^a  

^a TU DORTMUND UNIVERSITY   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

Flux; Resolution; Soft X ray beamline; Undulator

Indexed keywords

ABSORPTION SPECTROSCOPY; DIFFRACTION GRATINGS; ELECTRON BEAMS; EMISSION SPECTROSCOPY; INTERFACES (MATERIALS); MAGNETIC FIELD EFFECTS; PARAMETER ESTIMATION; RAY TRACING; SYNCHROTRONS;

FLUX; RESOLUTION; SOFT X-RAY BEAMLINE; UNDULATOR;

MONOCHROMATORS;

EID: 17444404939     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2005.01.287     Document Type: Conference Paper

References (11)

1. F. Riemer, and R. Torge Nucl. Instr. Meth. 208 1983 313
2. H. Petersen, C. Jung, C. Hellwig, W.B. Peatman, and W. Gudat Rev. Sci. Instrum. 66 1995 1 14
3. R. Follath, and F. Senf Nucl. Instr. Meth. A 390 1997 388
4. H. Wiedemann Synchrotron Radiation 2003 Springer Verlag Berlin
5. M. Scheer, WAVE - a program to calculate undulator sources, unpublished, BESSY.
6. A.D.O. Bawagan Chem. Phys. Lett. 334 2001 187 194
7. F. Schäfers, RAY - the BESSY raytrace program to calculate synchrotron radiation beamlines, Technischer Bericht TB 202, BESSY, 1996, pp. 1-37.
8. D. Schirmer, Synchrotron Radiation Sources at DELTA, Internal Report, DELTA, University of Dortmund (2004).
9. H. Petersen Opt. Commun. 40 1982 402
10. A.V. Pimpale, S.K. Deshpande, and V.G. Bhide Appl. Opt. 30 1991 1591
11. F. Schäfers, M. Krumrey, REFLEC - a program to calculate VUV and soft x-ray optical elements and synchrotron radiation beamlines, Technischer Bericht TB 201, BESSY, 1996, pp. 1-17.