Reclustering hyperspectral data using variance-based criteria

IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings

Volumn , Issue , 2004, Pages 309-312

  Bukhel, B ^a   Rotman, S R ^a   Blumberg, D G ^a  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; IMAGE ANALYSIS; IMAGE SEGMENTATION; MATHEMATICAL MODELS; PRINCIPAL COMPONENT ANALYSIS; SPECTRUM ANALYSIS;

CLUSTERING; HYPERSPECTRAL DATA; SEGMENTATION PROCESS; VARIANCE-BASED CRITERIA;

ALGORITHMS;

EID: 17444395617     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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