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Volumn 13, Issue 5, 2005, Pages 1696-1701

Characterization of a highly photorefractive RF-sputtered SiO 2-GeO2 waveguide

Author keywords

[No Author keywords available]

Indexed keywords

EXCIMER LASERS; GERMANIUM COMPOUNDS; IRRADIATION; KRYPTON; MAGNETRON SPUTTERING; PHOTOREFRACTIVE MATERIALS; REFRACTIVE INDEX;

EID: 17444394902     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OPEX.13.001696     Document Type: Article
Times cited : (34)

References (19)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.