LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO2

Journal of Electron Spectroscopy and Related Phenomena

Volumn 144-147, Issue , 2005, Pages 1163-1166

  Heun, S ^a   Kremmer, S ^b   Ercolani, D ^a,c   Wurmbauer, H ^b   Teichert, C ^b  

^a LABORATORIO TASC   (Italy)

^b UNIVERSITY OF LEOBEN   (Austria)

^c UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

Author keywords

C AFM; LEEM; SiO2; XPEEM

Indexed keywords

CONDUCTING ATOMIC FORCE MICROSCOPY (C-AFM); LOCAL ANODIC OXIDATION (LAO); LOW-ENERGY ELECTRON MICROSCOPY (LEEM); SIO2;

ATOMIC FORCE MICROSCOPY; ELECTRON MICROSCOPY; GROWTH (MATERIALS); OXIDATION; PHOTOEMISSION; SURFACE TREATMENT;

SILICON COMPOUNDS;

EID: 17444393245     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2005.01.170     Document Type: Conference Paper

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