Erratum: Simple accurate system for measuring absolute photoluminescence quantum efficiency in organic solid-state thin films (Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers (2004) 43 (7729))

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 2, 2005, Pages 1160-

  Kawamura, Yuichiro ^a   Sasabe, Hiroyuki ^a,b   Adachi, Chihaya ^a,b  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b CHITOSE INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

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EID: 17444382381     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.44.1160     Document Type: Erratum

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