Electrical prestressing of high-electric-field conduction in composite of low-density polyethylene/nano-SiOx

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 2, 2005, Pages 940-947

  Chen, Jiong ^a   Yin, Yi ^a   Li, Zhe ^a   Xiao, Dengming ^a  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

Electrical prestressing; High electric field conduction; Interface; Nano SiOx; Nanocomposite; Polyethylene

Indexed keywords

COMPOSITE MATERIALS; ELECTRIC FIELD EFFECTS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; SILICA; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

ELECTRICAL PRESTRESSING; HIGH-ELECTRIC-FIELD CONDUCTION; MICROSCOPIC STRUCTURE; NANO-SIOX;

LOW DENSITY POLYETHYLENES;

EID: 17444380106     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.44.940     Document Type: Article

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