Measurement of á-Al2O3 nanoparticle using AFM

Proceedings of the Second International Symposium on Instrumentation Science and Technology

Volumn , Issue , 2002, Pages

  Dang, Xueming ^a   Chen, Yuhang ^a   Huang, Wenhao ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

Al2O3; AFM; Nanoparticle; XRD

Indexed keywords

ATOMIC FORCE MICROSCOPY; CERAMIC MATERIALS; CHEMICAL INDUSTRY; MICA; MORPHOLOGY; NANOSTRUCTURED MATERIALS; PARTICLE SIZE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

ADATOMS; CLUSTER; SMALL ANGLE X RAY SCATTERING;

ALUMINA;

EID: 17344379415     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. R.Birringer, H.Gleiter, H.-P.Klein et al, "Nanocrystalline materials-an approach to a novel solid structure with gas-like disorder?", Phys. Lett. A, vol.102A, no.8,pp 365-369, 1984
2. Sterns L.C., Zhao J.H., Harmer P., "Processing and microstructure development in Al2O3-SiC nanocomposite", J. Eur. Ceram. Soc. 10, pp.473-477, 1992.
3. E Ponthieu, P. Grange, B. Delmon, "Proposal of a composition model for commercial AlN powders", J. Eur. Ceram. Soc. vol.8, no.4,pp. 233-41, 1992.
4. 2 composite ceramic membranes", J. Mem. Sci. 136, pp.152-160, 1997.
5. P. Chaudhari, M. S. Dresselhaus, "Materials physics", Reviews of Modern Physics, Vol. 71, No. 2, pp.331-335, 1999.
6. Zhang Lide, Mou Jimei, Nanomaterial, pp.53-57, Liao Ning science and technology press, Shenyang, 1994.
7. G. Reiss, F. Schneider, J. Vancea and H. Hoffmann, "Scanning tunneling microscopy on rough surfaces: Deconvolution of constant current images", Appl. Phys. Lett. vol.5, no.9,pp.867-869, 1990
8. J.S. Villarrubia, "Morphological estimation of tip geometry for scanned probe microscopy", Surf. Sci. 321, pp.287-300, 1994.