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Volumn 17, Issue 8, 2000, Pages

Integrated circuit susceptibility to conducted RF interference

Author keywords

[No Author keywords available]

Indexed keywords

ANTENNAS; BIPOLAR TRANSISTORS; CROSSTALK; DIGITAL INTEGRATED CIRCUITS; DISTORTION (WAVES); MOSFET DEVICES; OPERATIONAL AMPLIFIERS; PRINTED CIRCUIT DESIGN;

EID: 17344379068     PISSN: 08983577     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article
Times cited : (9)

References (9)
  • 1
    • 0018545592 scopus 로고
    • A Modified Ebers-Moll Transistor Model for RF-Interference Analysis
    • CE Larson and JE Roe, "A Modified Ebers-Moll Transistor Model for RF-Interference Analysis," IEEE Transactions on Electromagnetic Compatibility 21, no. 4 (1979): 283-290.
    • (1979) IEEE Transactions on Electromagnetic Compatibility , vol.21 , Issue.4 , pp. 283-290
    • Larson, C.E.1    Roe, J.E.2
  • 3
    • 0018681389 scopus 로고
    • Quiescent Operating Point Shift in Bipolar Transistors with AC Excitation
    • RE Richardson, "Quiescent Operating Point Shift in Bipolar Transistors with AC Excitation," IEEE Journal of Solid State Circuits 14, no. 6 (1979): 1087-1094.
    • (1979) IEEE Journal of Solid State Circuits , vol.14 , Issue.6 , pp. 1087-1094
    • Richardson, R.E.1
  • 6
    • 0026107990 scopus 로고
    • New Macromodels and Measurements for the Analysis of EMI Effects in 741 Op-Amp Circuit
    • S Graffi, G Masetti, and D Golzio, "New Macromodels and Measurements for the Analysis of EMI Effects in 741 Op-Amp Circuit," IEEE Transactions on Electromagnetic Compatibility 33, no. 1 (1991): 25-34.
    • (1991) IEEE Transactions on Electromagnetic Compatibility , vol.33 , Issue.1 , pp. 25-34
    • Graffi, S.1    Masetti, G.2    Golzio, D.3
  • 8
    • 0041982414 scopus 로고
    • Prediction of Delay Induced by in Band RFI in CMOS Inverters
    • JJ Laurin, "Prediction of Delay Induced by In Band RFI in CMOS Inverters," IEEE Transactions on Electromagnetic Compatibility 37, no. 2 (1995): 167-174.
    • (1995) IEEE Transactions on Electromagnetic Compatibility , vol.37 , Issue.2 , pp. 167-174
    • Laurin, J.J.1
  • 9
    • 0031385344 scopus 로고    scopus 로고
    • Investigation on VLSIs' Input Port Susceptibility to Conducted RF Interference
    • Austin, TX: Institute of Electrical and Electronics Engineers
    • F Fiori et al., "Investigation on VLSIs' Input Port Susceptibility to Conducted RF Interference," in Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (Austin, TX: Institute of Electrical and Electronics Engineers, 1997): 326-329.
    • (1997) Proceedings of the IEEE International Symposium on Electromagnetic Compatibility , pp. 326-329
    • Fiori, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.